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series | power | Resistance range | allowance |
TCR
|
Standard packing |
L (mm)
|
W (mm)
|
T (mm)
|
A (mm)
|
B (mm)
|
C (mm)
|
wskm2512 | 3w |
0.5mΩ
|
±1%(F)
±5%(J)
|
±100ppm
|
4000pcs |
6.4±0.2
|
3.2±0.2
|
0.8±0.15
|
0.76±0.2
5
|
0.51±0.25
|
2.3±0.2
|
1mΩ--4mΩ
|
1.5±0.2
|
||||||||||
1mΩ--4mΩ
|
±75ppm
|
0.85±0.2
|
Recommended pad and size (unit mm): | |||||
Serial number | Resistance value |
a (mm)
|
a (mm)
|
c (mm)
|
|
wskm2512 |
0.5mΩ--4mΩ
|
3.3
|
0.93 | 1.66 | |
5mΩ--50mΩ
|
2.29
|
0.93 | 3.68 |
PERFORMANCE INDEX :
|
||
ITEMS
|
STANDARD
|
TEST METHOD
|
Thermal shock
|
Within the specified value
|
IEC60115-14.8,Measured value -55°C+125°C, Reference value
+20°C
|
Solderability
|
No visible damage, weldable area
95% Minimum
|
IEC60115-14.17,245°C Tin slot, hold for 3 sec
|
Short-time
overload
|
No visible damage, △R±0.5%
Maximum
|
IEC60115-14.13,2.5 times rated voltage, 5 sec
|
Resistance to
solder heat
|
No visible damage, △R±0.5%
Maximum
|
IEC60115-14.18,270°C tin bath, hold for 10 sec
|
High temperature
and humidity
|
No visible damage, △R±1.0%
Maximum
|
AEC-Q200 Test 7/MIL-STD-202 method 103 temperature 85 ºC, humidity
85% of the conditions applied 10% of the rated power (current) or
component limit current (whichever is less), for 1000 hours.
|
High temperature
storage
|
No visible damage, △R±1.0%
Maximum
|
IEC60115-14.25.3,1000hours@170°C,Without load
|
Low temperature
load
|
No visible damage, △R±0.5%
Maximum
|
IEC60115-14.36,-55°C,No load for one hour, rated voltage load for
45 min, no load for 15 min
|
Temperature
cycling
|
No visible damage, △R±0.5%
Maximum
|
IEC60115-14.19,-55°C@30 min ~ room temperature @ <5 min ~
+155°C @ 30 min; 500 cycles
|
Load life
|
No visible damage, △R±1.0%
Maximum
|
IEC60115-14.25.1,1000 h @ 70°C, rated voltage, 90 min on, 30 min off
|